Showing results: 16 - 30 of 63 items found.
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Test Electronics
Spring Loaded Test Probes for Circuit Board Testing, "Pogo Pins" Test Electronics sources and stockes a large variety of Test Probes and Spring Loaded Test Pins. Let our applications engineers help you find the correct pin for your test fixture application.
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27430 -
Lisle Corp.
Heavy duty probe, cord and clamp. The probe is insulated with high-visibility shrink tubing to prevent the possibility of shorting the side of the probe to other components. Comes with a strain relief spring on the cord.
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CSP/Ballnest -
Aries
Any grid size available on 0.50mm pitch or larger. ZIF style socket using Aries solderless, gold plated pressure mount Spring Probe. The gold over nickel plated compression spring probes leave very small witness marks on the bottom surface of the device solderballs.
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Test Tooling Solutions Group
Probe pin is also known as pogo pin or spring probe. It is designed to test the connection between two circuit boards and devices or equipment under test.
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Harwin Plc
ATE Probes, Pogo pins and Contact Pads. Gold-plated, spring-loaded, capable of thousands of cycles. Probes for Automated Test Equipment (ATE). Various height SMT contact pins. Flat SMT contact pads. Spring loaded contacts consist of a plunger (or head), barrel (or body), and a fully encapsulated fine spring, to provide the spring force required to maintain positive contact. All have a high durability, exceeding 10,000 mating cycles.
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Leeno Industrial Inc.
Using the spring contact probes for semiconductor package inspection, customers can test various types of packages with LEENO's Total Interface Solution.
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Smiths Interconnect
Through our Hypertac, IDI and Sabritec technology brands, we supply application-specific, high-reliability electrical interconnect solutions from highly integrated assemblies to microminiature connectors and spring probe contacts. The core of our advanced interconnect solutions is our contact technologies: Hyperboloid, Tortac, Spring Probe, High Speed, Edge Card, Fiber Optic, EMI/EMP, High Power and High Temperature.
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NHK SPRING
Using our original micro springs and MC probes, these are highly durable products that are also lead-free. It is used for inspection of finished semiconductor products.
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MICRONICS JAPAN CO.LTD.
U-Probe for Multi-die Test of Memory IC. Vertical-Probe Needle Type Probe card suitable for multi-die test of devices with peripheral pads. ertical-Probe Spring Type. Probe card suitable for area array pad test. 64DUTs Multi-Die. Probe Card for RF devices. Fine Pitch.
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Smiths Interconnect
Smiths Interconnect offers Wafer Level Chip Scale Package (WLCSP) Probe Heads utilizing spring probe technology which provide high parallelism in test, superior signal integrity and high speed / RF testing capability.
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28400 -
Lisle Corp.
A heavy duty circuit tester for lifetime use. The probe, handle, cord and clamp are reinforced for extra durability. Comes with a strain relief spring on the cord. Cord is 49".
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80609010 -
6TL Engineering
The differential active probe helps to carry weak HF signals far away with the minimum disturbance of the original source. The module accepts discrete wiring or direct spring loaded test probe solder. In any case, the input signal wires might be as short as possible.
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Smiths Interconnect
Smiths Interconnect offers a broad range PCB connectors for harsh environments. A wide choice of configurations and terminations of signal, power, high speed, RF contacts and spring probes solutions.
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Smiths Interconnect
A Switch Probe is a spring contact probe and receptacle combination that is normally open, and after a designated travel the switch probe closes. The most common use for switch probes is in the cable harness testing industry. The switch probe is used to verify the correct location of a terminal in a connector while checking the retention force as well. Switch probes also verify the presence of nonconductive components such as caps for connectors or devices on a circuit board. Smiths Interconnect offers three standard sizes of switch probes.
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80609000 -
6TL Engineering
The single ended active probe helps to carry weak HF signals far away with the minimum disturbance of the original source. The module accepts discrete wiring or direct spring loaded test probe solder. In any case, the input signal wires might be as short as possible.